|
PROJECT
MENU
X-ray Technique
Optical Technique
Thermal Technique
THE CONCEPT
Conceptual drawing of in-line inspection
A combination of four modular inspection systems each employing a different non destructive testing technique for PCB inspection is to be developed. The non destructive testing techniques are based on digital radiography, thermal inspection, automated optical imaging and acoustic microscopy. The techniques shall be developed and their particular advantages in relation to PCB inspection shall be utilised to complement each other with the goal of a combined 100% defect detection coverage. Depending on any given PCB configuration that is to be inspected, the inspection modules shall be designed so that they can be used separately, together or interchanged to give the best results in terms of inspection coverage and inspection throughput.
MICROSCAN is a collaboration between the following organisations: TWI Ltd, X-TEK Systems Ltd, Lot Oriel GmbH, Machine Vision Products Inc, Microtel
technologie elettroniche s.p.a., Beta Electronics Ltd, Ultrasonic Sciences Ltd, Goodrich Control Systems Ltd,
Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V. and Kaunas University of Technology. The project is co-ordinated and managed by
TWI Ltd and is partly funded by the EC under the CRAFT programme ref: COOP-CT-2003-508613.
|
|