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PROJECT
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X-ray Technique
Optical Technique
Thermal Technique
SYSTEMS INTEGRATION - PHASE 2
![]() Background
From the start of the project, TWI took an active lead with respect to the integration of the four prototype inspection modules. One of the first efforts as part of development of the Microscan system was to get all partners to agree and work to common standards. Given the scope of the project and time restraints it was considered unrealistic to combine the inspection modules using a complex hardware and software scheme. Instead an agreement between the partners was made early on in the project to use IPC's SMEMA common standard for electronic boards material handling systems.
System Communications
Each module in the system is designed to operate in pull configuration for easy integration with another inspection module or other equipment on standard electronics manufacturing lines. (Pull systems mean the board will not leave a module until called by the next downstream node, eliminating the need for a separate cell controller for each node on the production line.) Each inspection module has been designed so that a pass or failed component is indicated by an alarm, an on screen flag, and an entry saved to a results file local to each prototype. In addition each inspection prototype PC has the capability to be networked via 10/100 Ethernet, thus allowing a remote operator to interrogate all the prototype results files for statistical analysis from a single PC connected to the network.
Fig.1 Prototype System Overview combining the four inspection modules SMEMA mechanical interface and conveyor development
For cost reasons, and because a proof in principle prototype was being developed rather
than a product for immediate launch into the commercial market, only the minimum
SMEMA mechanical equipment interface standards were adopted for the conveyor designs
as detailed in Table 1.
Table 1 Minimum mechanical interface SMEMA requirements
MICROSCAN is a collaboration between the following organisations: TWI Ltd, X-TEK Systems Ltd, Lot Oriel GmbH, Machine Vision Products Inc, Microtel
technologie elettroniche s.p.a., Beta Electronics Ltd, Ultrasonic Sciences Ltd, Goodrich Control Systems Ltd,
Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V. and Kaunas University of Technology. The project is co-ordinated and managed by
TWI Ltd and is partly funded by the EC under the CRAFT programme ref: COOP-CT-2003-508613.
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