PROJECT
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X-ray Technique
Optical Technique
Thermal Technique
Images & Videos - AOI Inspection module
Fig.1 The finalised AOI prototype inspection module
Fig.2 AOI Image processing software framework application developed for Microscan project
Fig.3 Early PCB bulb illumination experiments for AOI
Fig.4 Ring LED array mounted in experimental inspection chamber
PARTNERS
MICROSCAN is a collaboration between the following organisations: TWI Ltd, X-TEK Systems Ltd, Lot Oriel GmbH, Machine Vision Products Inc, Microtel
technologie elettroniche s.p.a., Beta Electronics Ltd, Ultrasonic Sciences Ltd, Goodrich Control Systems Ltd,
Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V. and Kaunas University of Technology. The project is co-ordinated and managed by
TWI Ltd and is partly funded by the EC under the CRAFT programme ref: COOP-CT-2003-508613.
